YLab · Citation record
Hysteresis Analysis of Graphene Transistor Under Repeated Test and Gate Voltage Stress
Journal of Semiconductors, 2014
BibTeX
@article{Yang2014Hysteresisanalysis,
title = {Hysteresis Analysis of Graphene Transistor Under Repeated Test and Gate Voltage Stress},
author = {Jie Yang and Kunpeng Jia and Yajuan Su and Yang Chen and Chao Zhao},
journal = {Journal of Semiconductors},
year = {2014},
url = {https://iopscience.iop.org/article/10.1088/1674-4926/35/9/094003}
}
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