YLab · Paper record
Hysteresis Analysis of Graphene Transistor Under Repeated Test and Gate Voltage Stress
Journal of Semiconductors, vol. 35, no. 9, pp. 094003, 2014
Abstract
An abstract is not available in the verified public metadata record.
Contribution highlights
A verified contribution summary is not available in the public metadata record.
Code and data
No verified public code or data link is recorded for this paper.
Publication metadata
- Volume
- 35
- Issue
- 9
- Pages / article
- 094003
Version relationship
No separate preprint-to-publication relationship is currently recorded.
BibTeX
@article{Yang2014Hysteresisanalysis,
title = {Hysteresis Analysis of Graphene Transistor Under Repeated Test and Gate Voltage Stress},
author = {Jie Yang and Kunpeng Jia and Yajuan Su and Yang Chen and Chao Zhao},
journal = {Journal of Semiconductors},
year = {2014},
url = {https://iopscience.iop.org/article/10.1088/1674-4926/35/9/094003},
doi = {10.1088/1674-4926/35/9/094003},
volume = {35},
number = {9},
pages = {094003}
}